IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529

• Type: Probe
• Usage: Metal
• Installation Mode: Handheld
• Certification: ISO
• Application: Industry, Communication Electronic Products, Special Equipment, Car/Motorcycle
• Baffle Plate Thickness: 45mm
• Model NO.: iec60529
• Baffle Plate Diameter: 45mm
• Handle Diameter: 10mm
• Handle Length: 100mm
• Ball Diameter: 50mm
• Force: 50n
• Warranty: 1year
• Delivery Time: 3-7days
• Standard: IEC 60529
• Product Name: IEC Test Sphere Probe with 50n Force
• Transport Package: Silver Package for Test Probe
• Specification: iec60529
• Trademark: bnd
• Origin: China
• Production Capacity: 1000PCS Per Month

Product Description

IEC 61032 IP1X Test Sphere Probe A with 50n Force in Table 6 of IEC60529

1. Standard :
IEC61032 IEC60950 IEC60335
IEC60529 IEC60045 IEC60884
IEC60745

2. Diameter :
Ball Diameter:50mm
Baffle Plate Diameter:45mm
Baffle Plate Thickness:45mm
Handle Diameter:10mm
Handle Length:100mm

3. Introduction :
Bending test (Test probe A) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

This probe is intended to verify the protection of person against access to hazardous parts. It is also used to verify the protection against access with the back of the hand

The RIGID SPHERE ( 50 mm . With guard) from BND is designed and manufactured to perform the test specified in many standards ( IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950 ) to prove the degree of protection for the first characteristic numerals IP1X.

Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.

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