IEC61032 IEC60529 IP2X Accessibility Probe B Test Finger
1. Specification:
The Standard Test Finger Probe / The Standard Test Knurled Finger Probe / Test Probe B / IP2X Protection Grade Probe
2. Technical Parameters:
1, Knurled Finger Diameter:12mm
2, Knurled Finger Length :80mm
3, Baffle Plate Diameter :50mm
4, Baffle Plate Length : 100mm
5According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032, IEC69745-1
3. Application:
1.The joint parts of the test finger cannot touch the live parts or hazardous parts, and the 50mm-20mm Baffle Plate cannot enter.
2.In the test requirements of preventing from approaching to the hazardous parts, the probe B test probe needs to with a 10±3N thrust. The product without force should be used with push-pull dynamometers.
3.In the test of against electric shock, wiring ,configuration and power and indicating device are needed. Turn on the power of the tested sample, and exert the corresponding force to determine whether the grounding line are connected (3 inserts).
4.Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance
4. Product Pictures :
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