• IEC61032 IEC 60529 IP1X Test Sphere Probe a
  • IEC61032 IEC 60529 IP1X Test Sphere Probe a
  • IEC61032 IEC 60529 IP1X Test Sphere Probe a
  • IEC61032 IEC 60529 IP1X Test Sphere Probe a
  • IEC61032 IEC 60529 IP1X Test Sphere Probe a
  • IEC61032 IEC 60529 IP1X Test Sphere Probe a

IEC61032 IEC 60529 IP1X Test Sphere Probe a

Warranty: One Year
Customized: Customized
Structure: Portable
Material: Stainless Steel
Certification: ISO
Application: Lab
Customization:
Gold Member Since 2016

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Guangdong, China
Importers and Exporters
The supplier has import and export rights
Cooperated with Fortune 500
This supplier has Cooperated with Fortune 500 companies
Years of Export Experience
The export experience of the supplier is more than 10 years
Patents Awarded
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Basic Info.

Model NO.
test probe A
Type
Measurement Type
Baffle Plate Thickness
45mm
Baffle Plate Diameter
45mm
Handle Diameter
10mm
Handle Length
100mm
Ball Diameter
50mm
Transport Package
Portable Case+Carton
Specification
iec60529
Trademark
bnd
Origin
China
Production Capacity
1000PCS Per Month

Product Description

IEC61032 IEC 60529 IP1X Test Sphere Probe A 

1. Introduction:
Bending test (Test probe A) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

This probe is intended to verify the protection of person against access to hazardous parts. It is also used to verify the protection against access with the back of the hand

The RIGID SPHERE ( 50 mm . With guard) from BND is designed and manufactured to perform the test specified in many standards ( IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950 ) to prove the degree of protection for the first characteristic numerals IP1X.

Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.


IEC61032 IEC 60529 IP1X Test Sphere Probe a
2. Standard:

IEC61032 IEC60950 IEC60335
IEC60529 IEC60045 IEC60884
IEC60745


3. Prameters:
Ball Diameter:50mm       Baffle Plate Diameter:45mm 
Baffle Plate Thickness:45mm     Handle Diameter:10mm     Handle Length:100mm

IEC61032 IEC 60529 IP1X Test Sphere Probe aIEC61032 IEC 60529 IP1X Test Sphere Probe aIEC61032 IEC 60529 IP1X Test Sphere Probe aIEC61032 IEC 60529 IP1X Test Sphere Probe a


Company  Profile :

IEC61032 IEC 60529 IP1X Test Sphere Probe a

 

 

Certifications :

IEC61032 IEC 60529 IP1X Test Sphere Probe a

 

IEC61032 IEC 60529 IP1X Test Sphere Probe a

 

 

Factory  Introduction :

IEC61032 IEC 60529 IP1X Test Sphere Probe a

 

 

Plant Warehouse :

IEC61032 IEC 60529 IP1X Test Sphere Probe a

Cooperative Customers & Brands:

IEC61032 IEC 60529 IP1X Test Sphere Probe a

Product  Packaging :

IEC61032 IEC 60529 IP1X Test Sphere Probe a



 

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