• IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
  • IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
  • IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
  • IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
  • IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
  • IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test

IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test

Function: Protection
Application: Industrial
Baffle Plate Diameter: 45mm
Customization:
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IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test pictures & photos
IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
US $199-399 / Piece
Min. Order: 1 Piece
Gold Member Since 2016

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Guangdong, China
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Basic Info.

Model NO.
BND-AF
Handle Diameter
10mm
Handle Length
100mm
Ball Diameter
50mm
Force
50n
Transport Package
Silver Package for Test Probe
Specification
IEC61032
Trademark
BONAD
Origin
Guang Dong, China
Production Capacity
1000PCS/Month

Packaging & Delivery

Package Size
37.00cm * 24.00cm * 18.00cm
Package Gross Weight
3.000kg

Product Description

IEC 61032 IP1X Test Sphere Probe A with 50n Force in Table 6 of IEC60529

1. Standard :
IEC61032 IEC60950 IEC60335
IEC60529 IEC60045 IEC60884
IEC60745


2. Diameter :
Ball Diameter:50mm
Baffle Plate Diameter:45mm
Baffle Plate Thickness:45mm
Handle Diameter:10mm
Handle Length:100mm


3. Introduction :
Bending test (Test probe A) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

This probe is intended to verify the protection of person against access to hazardous parts. It is also used to verify the protection against access with the back of the hand

The RIGID SPHERE ( 50 mm . With guard) from BND is designed and manufactured to perform the test specified in many standards ( IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950 ) to prove the degree of protection for the first characteristic numerals IP1X.

Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.


IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestIEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestIEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestIEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test

Company  Profile :IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestCertifications :IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestIEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestFactory  Introduction :IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestPlant Warehouse :IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric TestCooperative Customers & Brands:IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
Customer  Reviews :IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
Product  Packaging :IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test

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From payment to delivery, we protect your trading.
IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test pictures & photos
IEC 61032 IP1X Test Sphere Probe a with 50n Force for Anti-Electric Test
US $199-399 / Piece
Min. Order: 1 Piece
Gold Member Since 2016

Suppliers with verified business licenses

Secured Trading Service
Manufacturer/Factory
Management System Certification
ISO 9001
Terms of Payment
T/T, PayPal, Western Union